Forecasting tephra deposition: the impact of input parameter uncertainty on tephra deposition accuracy
Emmy Scott, Melody Whitehead, Stuart Mead, Mark Bebbington, Jonathan Procter
Affiliations: Massey University, Volcanic Risk Solutions, Aotearoa New Zealand
Presentation type: Poster
Presentation time: Thursday 16:30 - 18:30, Room Poster Hall
Poster Board Number: 266
Programme No: 6.4.13
Abstract
Accurate forecasts are critical to help mitigate the risks of volcanic hazards to society. While post-event modelling, or hindcasting, allows for input parameters to be reasonably well constrained through observations (e.g., plume height), or post eruption analyses (e.g., TGSD), forecasting these input parameter ranges prior to an eruption is much more uncertain. In these cases, forecasts rely on probabilistic estimates from limited data (e.g., IVESPA database) and expert judgement. From an impact-based perspective, a forecasted ashfall of 3mm rather than 2mm may have little impact, but forecasting 50mm when 200mm occurs could have major consequences and cause significant risk to life. Tephra deposition, even during hindcasts where input parameters are constrained through observation and post-eruptive studies, can deviate by up to a factor of 5 from actual ground deposits using current tephra dispersal models (e.g., Fall3D, Tephra2, HAZMAP). Correctly quantifying this uncertainty is also crucial to hazard mitigation. This research explores how input parameter ranges in tephra dispersion models Tephra2 and Fall3D influence ash deposition forecasts in the context of the next eruption. Specifically, we want to know how well input parameter ranges based on uninformed priors (i.e., we know nothing about the next eruption) and informed priors (i.e., we know things such as volcano type and previous eruption sizes and styles) can produce robust tephra deposition forecasts compared to real deposit data. Using the example of the 17 June 1996 Mount Ruapehu eruption in Aotearoa New Zealand, we evaluate how these priors impact forecast robustness and accuracy.